Byung-hyun Yim

Title: Byung-hyun Yim and Image Sensor Defect Detection

Introduction

Byung-hyun Yim is an inventor based in Yongin, South Korea, associated with Samsung Electronics Co., Ltd. His patent work includes a method for detecting defects in image sensors, with particular attention to defects related to the floating diffusion area.

Latest Patents

Yim is named on one patent: “Method of Detecting Defects in Image Sensor, Tester for the Method, and Control Signal Generator for the Method.” The invention describes a way to detect image-sensor defects by controlling the reset transistor during selected sampling zones, including reset-level and signal-level sampling. In the described sensor, a photodiode generates charges corresponding to an image signal, and a transmission transistor transfers those charges to the floating diffusion area in response to a control signal. A reset transistor applies a reset voltage to that area in response to a reset control signal. The patent also covers a tester and a control signal generator that use the method. Yim’s listed patent count is 1 patent.

Career Highlights

Yim’s documented patent contribution focuses on image-sensor testing and defect detection. The invention addresses how transistor operation during sampling can help identify faults associated with the floating diffusion area.

Collaborations

Jun-taek Lee and Kwang-hee Lee are identified as Yim’s coworkers. The patent information provided does not specify their roles in the invention.

Conclusion

Byung-hyun Yim’s patent work at Samsung Electronics Co., Ltd. centers on a method and related testing technology for detecting defects in image sensors.