Seongnam, South Korea

Byung Chang Kim

This inventor holds 1 USPTO granted patent. Top assignee: National Cancer Center. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Byung Chang Kim. Retrieved from https://idiyas.com/inventor/byung-chang-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Byung Chang Kim and a Patent-Based Approach to Colorectal Cancer Diagnosis.

Introduction

Byung Chang Kim is an inventor associated with Seongnam, South Korea, and the National Cancer Center. His patent work addresses a potential method for supporting colorectal cancer diagnosis through analysis of low-mass ions.

Latest Patents

Kim is associated with 1 patent: “Method for Crystallizing Low Mass Ions for Diagnosing Colorectal Cancer and Method for Diagnosing Colorectal Cancer Using Same.” The invention describes using a MALDI-TOF mass spectrometer and biostatistical analysis to identify low-mass ions extracted from a biological sample. It also outlines using those ions to provide information for colorectal cancer diagnosis. The proposed approach aims to offer low-cost, rapid analysis across large areas while enabling reliable discrimination.

Career Highlights

Kim’s listed patent connects his work with diagnostic technology and cancer research. His association with the National Cancer Center places this invention in the context of an institution focused on cancer-related research and care.

Collaborations

Sun Young Kim and Byong Chul Yoo are identified as Kim’s coworkers. The available information does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Byung Chang Kim’s patent describes a mass-spectrometry-based approach to colorectal cancer diagnosis, with an emphasis on speed, cost, and diagnostic discrimination.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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