Frisco, TX, United States of America

Byron W Harper

This inventor holds 1 USPTO granted patent. Top assignee: Stryker Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Byron W Harper. Retrieved from https://idiyas.com/inventor/byron-w-harper

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Byron W. Harper: Inventor of Fluid Management Systems

Introduction

Byron W. Harper is an inventor based in Frisco, Texas, whose patent work includes technology for managing fluids in surgical settings. He is associated with Stryker Corporation and holds 1 patent.

Latest Patents

Harper’s patent, “Fluid Management Systems and Methods,” describes software-controlled electromechanical devices used with single-use or reusable tubing sets. The systems can pressurize and warm fluids, monitor fluid deficits using flow or weight measurements, provide suction, collect fluids, and evacuate them either indirectly or directly to a drain. Their configurations can be adapted to different surgical environments, including operating rooms and physician offices, as well as user needs and preferences.

Career Highlights

Harper’s documented patent work focuses on fluid management technology for surgical applications. His association with Stryker Corporation connects this work to a company active in medical technology.

Collaborations

Harper’s listed coworkers include Benjamin T. Lorman and Matthew R. Biats. Their names are provided as professional associations, though specific collaborative roles on the patent are not detailed.

Conclusion

Byron W. Harper’s patent describes a configurable approach to fluid management that brings together monitoring, warming, suction, collection, and evacuation functions for surgical environments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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