This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015
Title: Byoungjun Min - Innovator in Semiconductor Testing Technology
Introduction
Byoungjun Min is a notable inventor based in Asan, South Korea. He has made significant contributions to the field of semiconductor testing technology. His innovative approach has led to the development of a unique test handler that enhances the efficiency of testing semiconductor devices.
Latest Patents
Byoungjun Min holds 1 patent for his invention titled "Test handler that rapidly transforms temperature and method of testing semiconductor device using the same." This patent describes a test handler that includes multiple chambers designed to create a sealed environment for semiconductor devices. The test module is electrically connected to these devices, allowing for a comprehensive testing process. The design incorporates a fluid path that circulates a coolant or heat medium, enabling rapid temperature changes during testing.
Career Highlights
Byoungjun Min is currently employed at Samsung Electronics Co., Ltd., a leading company in the technology sector. His work focuses on advancing semiconductor testing methodologies, which are crucial for ensuring the reliability and performance of electronic devices. His contributions have been instrumental in improving testing processes within the industry.
Collaborations
Throughout his career, Byoungjun Min has collaborated with esteemed colleagues, including Jea-Muk Oh and Jongpil Park. These partnerships have fostered innovation and have led to the successful development of advanced testing technologies.
Conclusion
Byoungjun Min's work in semiconductor testing technology exemplifies the impact of innovation in the electronics industry. His patented test handler represents a significant advancement in the field, showcasing his dedication to improving testing processes for semiconductor devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
