This inventor holds 1 USPTO granted patent. Top assignee: Semisysco Co., Ltd.. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Byoung-Chan Park: Innovator in Glass Substrate Measurement
Introduction
Byoung-Chan Park is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of optical measurement, particularly in the assessment of glass substrates. His innovative approach has led to the development of a unique system that enhances the accuracy of measuring irregularities in glass surfaces.
Latest Patents
Byoung-Chan Park holds a patent for a "System and method of measuring irregularity of a glass substrate." This invention utilizes reflection light from both the upper and lower surfaces of the glass substrate to determine its irregularity. The system comprises a light source that emits a first light to the glass substrate, which is then reflected. The reflected light is captured on a screen, allowing for the formation of lines that indicate the irregularities of the glass substrate. This method provides a more efficient and precise way to measure glass quality.
Career Highlights
Park is currently associated with Semisysco Co., Ltd., where he continues to innovate in the field of optical measurement technologies. His work has been instrumental in advancing the capabilities of glass substrate analysis, which is crucial for various applications in electronics and optics.
Collaborations
Throughout his career, Byoung-Chan Park has collaborated with talented individuals such as Bong-Joo Woo and Seong-Jin Choi. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Byoung-Chan Park's contributions to the measurement of glass substrates exemplify the impact of innovative thinking in technology. His patent and ongoing work at Semisysco Co., Ltd. highlight his commitment to advancing optical measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile