Company Filing History:
Years Active: 2004-2006
Title: Byeng Gi Lee: Innovator in Semiconductor Testing Technology
Introduction
Byeng Gi Lee is a notable inventor based in Kyonggi-do, South Korea. He has made significant contributions to the field of semiconductor testing, holding a total of 3 patents. His work focuses on improving the accuracy and efficiency of testing semiconductor devices.
Latest Patents
One of his latest patents is titled "Methods for compensating for a test temperature deviation." This invention addresses the issue of temperature deviations in semiconductor devices caused by heat generated during testing. By employing a real-time temperature measurement system, the method allows for precise control of the testing environment, ensuring that semiconductor devices are tested at the correct temperature. The process involves fitting semiconductor devices to test sockets, measuring their temperature, and adjusting cooling fluid application based on the measured temperature change rate.
Another significant patent is the "Device for compensating for a test temperature deviation in a semiconductor device handler." This invention provides a comprehensive solution for maintaining the desired temperature during testing. The semiconductor device handler includes an enclosed chamber, a heating/cooling apparatus, and a control unit that manages the spraying of cooling fluid to compensate for temperature changes. This innovation enhances the testing process and improves yield rates for semiconductor devices.
Career Highlights
Byeng Gi Lee has worked with prominent companies in the technology sector, including Mirae Corporation and LG Electronics Inc. His experience in these organizations has contributed to his expertise in semiconductor technology and testing methodologies.
Collaborations
Throughout his career, Byeng Gi Lee has collaborated with talented professionals, including Jae Myeong Song and Chul Ho Ham. These collaborations have further enriched his work and innovations in the semiconductor field.
Conclusion
Byeng Gi Lee's contributions to semiconductor testing technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in the industry and provide effective solutions to enhance testing accuracy and efficiency.