This inventor holds 1 USPTO granted patent. Top assignee: Kansas State University Research Foundation. Active years: 2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014
Title: Burdette Terry Beck: Innovator in Surface Strain Measurement
Introduction
Burdette Terry Beck is a notable inventor based in Manhattan, Kansas. He has made significant contributions to the field of optical sensors, particularly in measuring surface strain in various materials. His innovative approach has led to the development of a unique portable sensor that enhances the accuracy of strain measurements.
Latest Patents
Burdette Terry Beck holds a patent for a "Portable high-resolution non-contact modular sensor for surface strain measurement." This invention provides a portable optical sensor designed to measure surface strain in objects, such as pre-stressed concrete articles. The sensor consists of modular components, each equipped with a laser and an image sensor. When positioned near the object, the lasers illuminate specific areas of the surface, while the image sensors capture the reflected light to generate speckle images. By comparing these images taken under different stress conditions, accurate surface strain measurements can be obtained.
Career Highlights
Burdette is affiliated with the Kansas State University Research Foundation, where he continues to advance research in optical sensing technologies. His work has been instrumental in developing tools that improve the assessment of structural integrity in various applications.
Collaborations
Burdette has collaborated with esteemed colleagues, including Weixin Zhao and Robert J. Peterman. Their combined expertise has contributed to the success of his innovative projects.
Conclusion
Burdette Terry Beck's contributions to the field of surface strain measurement through his patented technology exemplify the impact of innovation in engineering. His work not only enhances measurement accuracy but also supports advancements in structural analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
