Long Beach, CA, United States of America

Bryson Jones

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Relativity Space, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bryson Jones. Retrieved from https://idiyas.com/inventor/bryson-jones

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Bryson Jones and Automated Defect Recognition

Introduction

Bryson Jones is an inventor associated with Long Beach, California, and Relativity Space, Inc. His patent work addresses automated analysis of radiographic images to identify and assess pore defects in manufactured articles.

Latest Patents

Jones is named on one patent, Automated Defect Recognition and Determinations of Pore Cluster Compliance. The described process obtains a radiographic (RT) image of an article that includes a reference feature. It identifies overlapping image portions and classifies their pixels using a pore-classification model. The process then generates a pore map and maps it onto the article using sensor data. Regions that exceed rejection thresholds under predefined rules are identified and displayed. Jones is associated with 1 patent.

Career Highlights

The patent reflects work on applying image processing and classification methods to defect recognition and pore-cluster compliance. This approach can help present detected regions for evaluation against established rejection criteria.

Collaborations

Jones’s listed coworkers include Christopher Sacco and Viraj Sinha. His company affiliation is Relativity Space, Inc.

Conclusion

Bryson Jones’s patent focuses on using radiographic imaging, pore classification, and sensor data to identify and display regions that may fail predefined compliance thresholds.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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