Clifton Park, NY, United States of America

Bruno K B De Man


Average Co-Inventor Count = 3.1

ph-index = 6

Forward Citations = 165(Granted Patents)


Company Filing History:


Years Active: 2007-2010

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7 patents (USPTO):Explore Patents

Title: Innovations of Bruno K B De Man

Introduction

Bruno K B De Man is a notable inventor based in Clifton Park, NY (US). He has made significant contributions to the field of computed tomography and x-ray diffraction systems. With a total of 7 patents, his work has advanced the technology used in medical imaging and material analysis.

Latest Patents

One of his latest patents is titled "Methods for analytic reconstruction for mult-source inverse geometry CT." This patent discloses methods for reconstructing x-ray projection data acquired using a multi-source, inverse-geometry computed tomography (IGCT) scanner. The first method processes an IGCT sinogram by rebinning first in 'z' and then in "xy," applying feathering during the "xy" rebinning. This results in a multi-axial 3-generation sinogram, which can be further processed using a parallel derivative and/or Hilbert transform. Additionally, a TOM-window technique and a combined backprojection technique may be applied to produce a reconstructed volume. The second method processes an IGCT sinogram using parallel derivative and/or redundancy weighting, along with signum weighting, TOM-windowing, backprojection, and Hilbert Inversion to generate another reconstructed volume.

Another significant patent is "X-ray source and detector configuration for a non-translational x-ray diffraction system." This patent describes a system and method for scanning objects using a non-translational x-ray diffraction (XRD) system. The system includes a scanning area through which an object traverses and a distributed x-ray source with multiple focal spot locations. The x-ray source emits x-rays towards the object as parallel beams, while a stationary detector measures the coherent scatter spectra of the x-rays after they pass through the object. A data acquisition system is connected to the detector to generate XRD data and determine the material composition of the object.

Career Highlights

Bruno K B De Man has worked with prominent organizations such as General Electric Company and Leland Stanford Junior University. His experience in these institutions has contributed to his expertise in the field of imaging technologies.

Collaborations

He has collaborated with notable individuals, including Samit Kumar Basu and Norbert Joseph Pelc, who have also made significant contributions to the field.

Conclusion

Bruno K B De Man's innovative work in computed tomography and x-ray

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