The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Apr. 27, 2007
Zhye Yin, Schenectady, NY (US);
Jed Douglas Pack, Glenville, NY (US);
Bruno K. B. DE Man, Clifton Park, NY (US);
Norbert J. Pelc, Los Altos, CA (US);
Zhye Yin, Schenectady, NY (US);
Jed Douglas Pack, Glenville, NY (US);
Bruno K. B. De Man, Clifton Park, NY (US);
Norbert J. Pelc, Los Altos, CA (US);
General Electric Company, Schenectady, NY (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Abstract
Disclosed are embodiments of methods for reconstructing x-ray projection data (e.g., one or more sinograms) acquired using a multi-source, inverse-geometry computed tomography ('IGCT') scanner. One embodiment of a first method processes an IGCT sinogram by rebinning first in 'z' and then in “xy,” with feathering applied during the “xy” rebinning. This produces an equivalent of a multi-axial 3generation sinogram, which may be further processed using a parallel derivative and/or Hilbert transform. A TOM-window (with feathering) technique and a combines backprojection technique may also be applied to produce a reconstructed volume. An embodiment of a second method processes an IGCT sinogram using a parallel derivative and/or redundancy weighting. The second method may also use signum weighting, TOM-windowing (with feathering), backprojection, and a Hilbert Inversion to produce another reconstructed volume.