Riedisheim, France

Bruno Denner

This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: Sappel. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bruno Denner. Retrieved from https://idiyas.com/inventor/bruno-denner

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2015

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2 patents (USPTO):Explore Patents

Title: Bruno Denner: Innovator in Fluid Measurement Technology

Introduction

Bruno Denner is a notable inventor based in Riedisheim, France. He has made significant contributions to the field of fluid measurement technology, holding a total of 2 patents. His innovative designs focus on improving the efficiency and accuracy of fluid flow measurement devices.

Latest Patents

Denner's latest patents include a "Fluid turbine flow meter with centering bearing" and a "Fluid turbine flow meter." The first patent describes a fluid turbine flow meter that features a measurement chamber and a turbine body that moves axially based on fluid flow rates. This design incorporates a centering bearing that supports the rotation axis, ensuring precise measurements. The second patent outlines a fluid turbine flow meter that includes a rotatable turbine body equipped with longitudinal blades and support arms. Each blade is designed with separate longitudinal thrust members that optimize fluid circulation and measurement accuracy.

Career Highlights

Throughout his career, Bruno Denner has worked with several companies, including Sappel and Diehl Metering S.a.s. His experience in these organizations has allowed him to refine his skills and contribute to advancements in fluid measurement technologies.

Collaborations

Due to space constraints, the details of his collaborations will not be included.

Conclusion

Bruno Denner's innovative work in fluid measurement technology has led to the development of advanced devices that enhance measurement accuracy and efficiency. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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