St. Gallen, Switzerland

Bruno Bischoff

This inventor holds 1 USPTO granted patent. Top assignee: Gebruder Buhler Ag. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bruno Bischoff. Retrieved from https://idiyas.com/inventor/bruno-bischoff

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 19(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Bruno Bischoff: Innovator in Infrared Measurement Technology

Introduction

Bruno Bischoff is a notable inventor based in St. Gallen, Switzerland. He has made significant contributions to the field of measurement technology, particularly with his innovative work in infrared measuring apparatuses. His expertise and dedication to advancing technology have earned him recognition in the industry.

Latest Patents

Bruno Bischoff holds a patent for an infrared measuring apparatus and process for continuous quantitative measurement. This invention showcases his ability to develop solutions that enhance measurement accuracy and efficiency in various applications. He has 1 patent to his name, reflecting his commitment to innovation.

Career Highlights

Bruno is currently associated with Gebrüder Bühler AG, a company known for its advanced technology solutions. His role at the company allows him to apply his inventive skills and contribute to the development of cutting-edge measurement technologies. His work has had a positive impact on the company's product offerings and overall innovation strategy.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Bruno Bischoff is a distinguished inventor whose work in infrared measurement technology exemplifies innovation and dedication. His contributions continue to influence the industry and inspire future advancements in measurement solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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