Bruce Worster

Title: Bruce Worster: Innovator in Laser Imaging and Spectral Analysis

Introduction

Bruce Worster is a notable inventor based in Saratoga, California. He has made significant contributions to the field of laser imaging and spectral analysis. His innovative work has led to the development of a unique system that enhances the analysis of objects through advanced technology.

Latest Patents

Worster holds a patent for an "Integrated Laser Imaging and Spectral Analysis System." This system features two operating modes: a scanned imaging mode and a stop scan spectral analysis mode. In the scanned imaging mode, a beam scanner is optically connected to a laser, allowing it to receive and scan laser beams. The system includes a lens, such as an objective lens, which focuses the beams received from the beam scanner. A sensor, optically coupled to the lens, detects characteristics of the beam, including color and intensity. During the stop scan spectral analysis mode, a spectrometer generates wavelength spectrum data, providing valuable insights into the analyzed object.

Career Highlights

Bruce Worster has had a successful career, working at Uniphase Corporation, where he has been able to apply his expertise in laser technology. His innovative approach has positioned him as a key figure in the development of advanced imaging systems.

Collaborations

Worster has collaborated with notable colleagues, including James Jianguo Xu and Ken K Lee. These partnerships have contributed to the advancement of technology in their respective fields.

Conclusion

In summary, Bruce Worster is a distinguished inventor whose work in laser imaging and spectral analysis has made a significant impact. His patented system exemplifies innovation and technological advancement in the analysis of objects.