Bruce R Parnas

Title: Bruce R Parnas: Innovator in Integrated Circuit Testing

Introduction

Bruce R Parnas is a notable inventor based in Santa Clara, CA, specializing in integrated circuit (IC) testing technologies. He has made significant contributions to the field, holding 2 patents that enhance the efficiency and effectiveness of IC testing processes.

Latest Patents

One of his latest patents is the "Event Based IC Test System." This innovative system is designed for testing an IC device under test (DUT) within an automatic electronic design (EDA) environment. The event-based test system includes an event memory that stores event data derived directly from the simulation of design data for the intended IC. The event data denotes each event with a time index indicating the duration from a predetermined point and an event type indicating the nature of the change at that event. Additionally, the system features an event generation unit that produces test vectors based on the event data, where the waveform of each vector is determined by the event type, and the timing is based on the accumulated time index of previous events. The system also includes means for supplying test vectors to the DUT and evaluating its response outputs at predetermined timings.

Another significant patent is the "Test Language Conversion Method." This method involves converting test vectors from an original cycle-based test language into a target cycle-based test language. It achieves this by forming a set of templates that depict waveforms defined in the target test language. The method decomposes a waveform in the original test language into a set of constituent events, each containing data that shows at least a starting value and a number of subsequent edges of the waveform. The process includes comparing the template and the set of constituent events at various levels of abstraction, storing the waveform data in the target test language when a match is detected, and retrieving corresponding parameters of the waveform in the original test language.

Career Highlights

Bruce R Parnas is currently employed at Adv Antest Corporation, where he continues to innovate in the field of IC testing. His work has significantly impacted the efficiency of testing processes, making them more reliable and effective.

Collaborations

Throughout his career, Bruce has collaborated with talented individuals such as Rochit Rajsuman and Shigeru Sugamori. These collaborations have contributed to the advancement of technologies in the field of integrated circuits.

Conclusion

Bruce R Parnas is a distinguished inventor whose