Del Mar, CA, United States of America

Bruce E Wade


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: Bruce E. Wade: Innovator in Ultrasonic Measurement Technology

Introduction

Bruce E. Wade is a notable inventor based in Del Mar, California. He has made significant contributions to the field of ultrasonic measurement technology. His innovative approach has led to the development of a unique apparatus that enhances the accuracy and reliability of ultrasonic measurements.

Latest Patents

Wade holds a patent for an "Apparatus for performing ultrasonic measurements." This apparatus is designed to measure compliant material specimens using a pair of ultrasonic transducers. The transducers are positioned facing each other, allowing for the transmission and reception of ultrasonic signals through the specimen. The apparatus features a structure that applies a controllable compressive force to ensure consistent measurements. Additionally, it includes a gauge for measuring the separation between the transducers and a controller for managing the signal transmission and reception. This invention enables the determination of comparable ultrasonic properties across different points on a specimen and among multiple specimens under identical conditions.

Career Highlights

Bruce E. Wade is associated with Expert System Technologies, Inc., where he continues to advance his work in ultrasonic measurement technology. His dedication to innovation has positioned him as a key figure in his field.

Collaborations

Wade collaborates with Carlos A. Salvado, contributing to the development and refinement of ultrasonic measurement techniques.

Conclusion

Bruce E. Wade's contributions to ultrasonic measurement technology exemplify the impact of innovative thinking in engineering. His patented apparatus represents a significant advancement in the field, showcasing his commitment to enhancing measurement accuracy and reliability.

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