This inventor holds 2 USPTO granted patents, plus 3 CIPO patents. Top assignee: P B Diagnostic Systems, Inc.. Active years: 1990.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990
Title: Innovations by Bruce E. Miller
Introduction
Bruce E. Miller is an accomplished inventor based in Brighton, MA (US). He has made significant contributions to the field of optical systems and immunoassay methods. With a total of two patents to his name, Miller's work focuses on enhancing the reliability and cost-effectiveness of optical read systems.
Latest Patents
Miller's latest patents include an "Optical Read System" and an "Optical Read Head for Immunoassay Instrument." The optical read system is a low-cost solution that utilizes a low ultraviolet output tungsten halogen light source along with solid-state photodetectors and circuitry. This innovative design aims to provide reliable fluorometric test results. The system achieves dependable outcomes by incorporating highly ultraviolet transmissive optics to maximize light throughput. Additionally, it employs solid-state circuitry combined with a filter wheel that features both light-blocking and light-passing regions, effectively addressing noise and dark signals associated with solid-state photodetectors.
Career Highlights
Miller is currently associated with P B Diagnostic Systems, Inc., where he continues to develop and refine his inventions. His work has been instrumental in advancing the capabilities of optical systems in diagnostic applications.
Collaborations
Miller has collaborated with notable colleagues, including Mark S. Bowen and Stephen D. Fantone. Their combined expertise has contributed to the success of various projects within the company.
Conclusion
Bruce E. Miller's innovative contributions to optical systems and immunoassay methods highlight his commitment to advancing technology in the diagnostic field. His patents reflect a dedication to improving reliability and cost-effectiveness in testing systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile