This inventor holds 2 USPTO granted patents. Top assignee: Wyko, Inc.. Active years: 1999-2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1999-2001
Title: Brian W. Becker: Innovator in Surface Profiling Technology
Introduction
Brian W. Becker is a notable inventor based in Tucson, Arizona. He has made significant contributions to the field of surface profiling technology. With a total of 2 patents, Becker's work focuses on methods that enhance the accuracy and efficiency of surface measurements.
Latest Patents
Becker's latest patents include a "Method of combining multiple sets of overlapping surface-profile interferometric data to produce a continuous composite map." This innovative method involves taking successive measurements of adjacent sections of a test surface. By sequentially placing these sections within the field of view of the instrument, he profiles them using phase shifting or vertical scanning techniques. The x-y translation of the microscope is carefully managed to maintain spatial continuity between measurements. The height data generated for each section is then combined to create a larger image of the entire surface. Discontinuities and errors introduced during the x-y translation process are corrected by normalizing the overlapping portions to a common reference plane. Each set of measured heights in the overlapping regions is fitted with a plane, and adjustments are made to ensure matching overlapping height data in adjacent sections. This meticulous process results in a continuous normalized image of the test surface.
Career Highlights
Brian W. Becker is currently employed at Wyko, Inc., where he continues to develop and refine his innovative techniques. His work has garnered attention for its practical applications in various industries that require precise surface measurements.
Collaborations
Becker collaborates with Mark A. Schmucker, leveraging their combined expertise to advance their projects and innovations.
Conclusion
Brian W. Becker's contributions to surface profiling technology exemplify the impact of innovation in engineering. His patents reflect a commitment to improving measurement techniques, which can benefit numerous applications in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile