Fairfax Station, VA, United States of America

Brian Tierney

This inventor holds 1 USPTO granted patent. Top assignee: USA as Represented by Secretary of the Navy. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Brian Tierney. Retrieved from https://idiyas.com/inventor/brian-tierney-rxep0wdl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Brian Tierney: Innovator in Millimeter-Wave Radar Technology

Introduction

Brian Tierney is a notable inventor based in Fairfax Station, VA (US). He has made significant contributions to the field of autonomous unmanned aerial vehicles (UAVs). His innovative work focuses on adapting automotive millimeter-wave (mmW) radar technology for UAV systems.

Latest Patents

Brian Tierney holds a patent for "Millimeter-wave radar for unmanned aerial vehicle swarming, tracking, and collision avoidance." This patent addresses the challenges of integrating mmW radar technology into UAV systems. The systems and methods outlined in his patent provide solutions for utilizing a limited number of antenna channels to effectively scan in both azimuth and elevation.

Career Highlights

Brian Tierney is currently associated with the United States Navy, where he contributes his expertise in radar technology. His work is pivotal in advancing the capabilities of UAVs, particularly in swarming, tracking, and collision avoidance scenarios.

Collaborations

Brian collaborates with Christopher T. Rodenbeck, enhancing the development of innovative radar solutions for UAV applications.

Conclusion

Brian Tierney's contributions to millimeter-wave radar technology significantly impact the future of autonomous UAV systems. His innovative patent showcases his commitment to advancing technology in this critical field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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