Rockford, IL, United States of America

Brian Ross

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Hamilton Sundstrand Corporation. Active years: 2023-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Brian Ross. Retrieved from https://idiyas.com/inventor/brian-ross-rdr14uzr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2023-2026

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2 patents (USPTO):Explore Patents

Title: Brian Ross - Innovator in Logic Gate Systems

Introduction

Brian Ross is a notable inventor based in Rockford, IL (US). He has made significant contributions to the field of electronics, particularly in the development of logic gate systems. His innovative approach has led to the creation of a patent that enhances fault testing methods in electronic circuits.

Latest Patents

Brian Ross holds a patent for "Stimulated circuits and fault testing methods." This invention involves a logic gate system designed for fault insertion testing. The system includes a logic gate module with multiple input pins, such as an input signal pin, a power supply input pin, and a test input pin. The design allows for effective testing and troubleshooting of electronic circuits, making it a valuable asset in the industry.

Career Highlights

Brian Ross is currently employed at Hamilton Sundstrand Corporation, where he applies his expertise in electronics and innovation. His work focuses on developing advanced technologies that improve the reliability and efficiency of electronic systems. With a patent to his name, he has established himself as a key player in the field.

Collaborations

Brian collaborates with Christopher Blazer, a fellow innovator at Hamilton Sundstrand Corporation. Together, they work on projects that push the boundaries of electronic design and testing methodologies.

Conclusion

Brian Ross is a distinguished inventor whose work in logic gate systems has made a significant impact on fault testing methods in electronics. His contributions continue to influence the industry and pave the way for future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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