Brian Lee Deitrich

Title: Brian Lee Deitrich: Innovator in JTAG Technology

Introduction

Brian Lee Deitrich is a notable inventor based in Champaign, IL (US). He has made significant contributions to the field of boundary-scan testing technology. His work primarily focuses on enhancing the efficiency and effectiveness of JTAG modules.

Latest Patents

Brian Lee Deitrich holds a patent for a "Hierarchically managed boundary-scan testable module and method." This innovative JTAG module includes a master component and multiple slave components. The master component features a TAP controller and related control circuits. Through a control bus, the TAP controller manages boundary-scan registers on the slave components. The design allows for a boundary-scan chain that originates and terminates at the master component. Notably, the TAP controller circuitry may be omitted from the slave components, enhancing modularity. The boundary-scan registers are partitioned into external and internal sections, with external sections accessible from outside the module.

Career Highlights

Brian is currently employed at Motorola Corporation, where he continues to develop cutting-edge technologies. His work has been instrumental in advancing the capabilities of boundary-scan testing.

Collaborations

Throughout his career, Brian has collaborated with notable colleagues, including Paul Robert Handly and Robert Francis Yockey. These partnerships have contributed to the success of his projects and innovations.

Conclusion

Brian Lee Deitrich's contributions to JTAG technology and boundary-scan testing have made a significant impact in the field. His innovative approach continues to influence advancements in electronic testing methodologies.