San Diego, CA, United States of America

Brian L Ganz


Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 40(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Brian L. Ganz

Introduction

Brian L. Ganz is a notable inventor based in San Diego, CA. He has made significant contributions to the field of electronic inspection technology. His work focuses on enhancing the quality and efficiency of inspecting integrated circuits.

Latest Patents

Brian L. Ganz holds a patent for a "Method and apparatus for high resolution inspection of electronic items." This invention features a high-resolution laminography system designed for the inspection of integrated circuits. The system utilizes a beam of highly focused electrons traced in a circular pattern on a flat target within a vacuum chamber. The target converts the electron beam into X-rays, producing a source of X-rays that rotates in synchronization with a rotating detector assembly. An object is placed within the vacuum chamber, allowing for the production of an X-ray cross-sectional image of a cutting plane of the object. The invention includes a computer and feedback system that controls image acquisition and an automated positioning system. Additionally, the computer system can operate under program control to automatically analyze data, measure characteristics of the object under inspection, and make decisions regarding the acceptability of the object's quality.

Career Highlights

Brian L. Ganz is associated with Four Pi Systems Corporation, where he continues to innovate in the field of electronic inspection. His work has been instrumental in advancing technologies that ensure the quality of electronic components.

Collaborations

Some of his notable coworkers include John Andrew Adams and Bruce D. Baker. Their collaborative efforts contribute to the innovative environment at Four Pi Systems Corporation.

Conclusion

Brian L. Ganz's contributions to electronic inspection technology exemplify the impact of innovation in ensuring the quality of integrated circuits. His patented methods and systems represent a significant advancement in the field.

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