Clinton Township, MI, United States of America

Brian J Wampler

This inventor holds 1 USPTO granted patent. Top assignee: Ford Global Technolgoies, LLC. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Brian J Wampler. Retrieved from https://idiyas.com/inventor/brian-j-wampler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Brian J Wampler: Innovator in Friction Measurement Technology

Introduction

Brian J Wampler is an accomplished inventor based in Clinton Township, MI (US). He has made significant contributions to the field of friction measurement technology. With a focus on practical applications, Wampler's work has the potential to impact various industries.

Latest Patents

Wampler holds a patent for a "Device for measuring coefficient of friction." This innovative device is designed to measure the coefficient of friction between a test surface and a test material. It comprises a frame, a skid pad made of the test material, and a longitudinal force measuring device. The device outputs data indicative of the longitudinal force applied, providing valuable insights into frictional properties.

Career Highlights

Wampler is currently employed at Ford Global Technologies, LLC, where he continues to develop and refine his inventions. His work at Ford allows him to collaborate with other talented professionals in the field of technology and innovation.

Collaborations

Some of Wampler's notable coworkers include Timothy J Kapelanski and Kurt Kramer Schleif. Their collective expertise contributes to the advancement of technology within their organization.

Conclusion

Brian J Wampler is a notable inventor whose work in friction measurement technology exemplifies innovation in engineering. His contributions are paving the way for advancements in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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