Portland, OR, United States of America

Brian J Denheyer


Average Co-Inventor Count = 2.6

ph-index = 5

Forward Citations = 104(Granted Patents)


Company Filing History:


Years Active: 1997-2009

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6 patents (USPTO):Explore Patents

Title: Brian J. Denheyer: Innovator in Integrated Circuit Testing

Introduction

Brian J. Denheyer, based in Portland, OR, is a notable inventor with a significant contribution to the field of integrated circuit (IC) testing. With a total of six patents to his name, Denheyer has made substantial advancements in the technology that ensures the functionality and reliability of IC packages under varying conditions.

Latest Patents

Denheyer's latest innovations include two groundbreaking patents. The first is a "Burn-in Testing Apparatus and Method," which describes an integrated circuit package testing apparatus that incorporates a temperature sensor, heater or cooler, and controller within a single modular unit. The microprocessor-based controller allows users to input a selected testing temperature, enabling individualized control for each IC package during testing. This modular system facilitates the quick attachment and removal of IC packages, streamlining the testing process.

The second patent, titled "Temperature Sensing and Prediction in IC Sockets," provides a novel apparatus and method that enhances temperature control for integrated circuits. This device combines temperature sensing and prediction through a current sensing mechanism that measures current flowing through an IC. An electronic controller calculates the power consumed by the IC and adjusts the temperature of a heater or cooler based on real-time measurements, ensuring more accurate temperature regulation.

Career Highlights

Throughout his career, Denheyer has been associated with several companies that have benefited from his expertise, including Wells-CTI, Inc. His innovative approach has played a crucial role in advancing IC testing technologies within these organizations.

Collaborations

Denheyer has worked alongside talented individuals, including Christopher A. Lopez and Gordon B. Kuenster. Their collaboration has undoubtedly fostered innovation and contributed to the successful development of advanced testing methodologies.

Conclusion

Brian J. Denheyer's contributions to the field of integrated circuits are highly significant, marked by his six patents that showcase his innovative spirit. His work continues to influence the ways in which ICs are tested, ensuring better performance and reliability in technology-driven industries.

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