Vancouver, Canada

Brian Dewan

This inventor holds 1 USPTO granted patent. Top assignee: Cae Newnes Ltd.. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Brian Dewan. Retrieved from https://idiyas.com/inventor/brian-dewan-zspggncp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Brian Dewan - Innovator in Sub-Pixel Resolution Technology

Introduction

Brian Dewan is a notable inventor based in Vancouver, Canada. He has made significant contributions to the field of distance measuring devices through his innovative patent. His work focuses on optimizing sub-pixel resolution, which is crucial for enhancing the accuracy of measurements in various applications.

Latest Patents

Brian Dewan holds a patent for a "Method and apparatus for optimizing sub-pixel resolution in a triangulation based target distance measuring device." This invention involves an apparatus that utilizes a laser light source to project a light beam onto a workpiece surface. The system includes a lens that gathers reflected light and a linear photodetector array that detects the light, generating an output signal indicative of the pixel positions being impinged by the light. The design aims to optimize the output signal by defocusing the image to a near-Scheimpflug condition, allowing for precise measurements even with movement of the workpiece.

Career Highlights

Brian Dewan is associated with Cae Newnes Ltd., where he applies his expertise in developing advanced measurement technologies. His work has been instrumental in improving the performance of triangulation-based distance measuring devices.

Collaborations

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Conclusion

Brian Dewan's innovative approach to optimizing sub-pixel resolution has made a significant impact in the field of distance measurement technology. His contributions continue to influence advancements in precision measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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