Company Filing History:
Years Active: 2025
Title: Brian Au - Innovator in Structured Light Metrology
Introduction
Brian Au is a notable inventor based in El Monte, California. He has made significant contributions to the field of structured light metrology, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of scanning objects using advanced metrology systems.
Latest Patents
Brian Au holds a patent titled "Optimal parameter selection for structured light metrology." This patent discloses a method for selecting an optimal value for an adjustable parameter of a structured light metrology (SLM) system used for scanning objects. The SLM system performs test scans to acquire multiple sets of measurements, utilizing different parameter values for each scan. A quality metric is calculated for each test scan based on the measurements and simulation data. The method identifies a test scan that meets a specified optimization criterion, allowing for the selection of the optimal parameter value for future scans.
Career Highlights
Brian Au is currently employed at Lawrence Livermore National Security, LLC, where he applies his expertise in structured light metrology. His innovative approach has contributed to advancements in the field, making significant impacts on the accuracy of object scanning technologies.
Collaborations
Brian Au has collaborated with notable colleagues, including Brian Giera and Adam W. Jaycox. These collaborations have fostered a productive environment for innovation and development in their respective fields.
Conclusion
Brian Au's contributions to structured light metrology exemplify the importance of innovation in technology. His patent and work at Lawrence Livermore National Security, LLC highlight his commitment to advancing metrology systems.