IJsselstein, Netherlands

Bram Veenhuizen

This inventor holds 1 USPTO granted patent. Top assignee: Skf Nova Ab. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bram Veenhuizen. Retrieved from https://idiyas.com/inventor/bram-veenhuizen-7ke9hwee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Bram Veenhuizen: Innovator in Sensor Technology

Introduction

Bram Veenhuizen is a notable inventor based in IJsselstein, Netherlands. He has made significant contributions to the field of sensor technology, particularly in the measurement of preloads in mechanical components.

Latest Patents

Veenhuizen holds a patent for a sensor system designed to measure preloads in screws, bolts, and similar objects. This innovative system includes sensor means made from magnetoelastic material that is sensitive to the preloads experienced by the object. The sensing device features a contact portion that partially surrounds the sensor means, and the magnetoelastic material is excited with an excitation frequency of at least 300 kHz. He has 1 patent to his name.

Career Highlights

Bram Veenhuizen is currently employed at SKF Nova AB, where he continues to develop and refine sensor technologies. His work has been instrumental in advancing the capabilities of measurement systems in various applications.

Collaborations

Veenhuizen collaborates with talented professionals in his field, including Thomas Larsson and Tore Hesthamar. Their combined expertise contributes to the innovative projects at SKF Nova AB.

Conclusion

Bram Veenhuizen is a distinguished inventor whose work in sensor technology has made a lasting impact. His innovative sensor system exemplifies the advancements in measuring preloads, showcasing his commitment to engineering excellence.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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