This inventor holds 1 USPTO granted patent. Top assignee: United States of America as Represented by the Administrator of NASA. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: Innovations of Bradley S Sealey in Thermal Conductivity Measurement
Introduction
Bradley S Sealey is an accomplished inventor based in Newport News, VA (US). He has made significant contributions to the field of thermal conductivity measurement, particularly through his innovative patent. His work is recognized for its precision and effectiveness in measuring the thermal properties of thin films.
Latest Patents
Bradley S Sealey holds a patent for a "Device and method for measuring thermal conductivity of thin films." This invention provides a method for accurately measuring the thermal conductivity of rigid or flexible, homogeneous or heterogeneous thin films that are between 50 µm and 150 µm thick. The device is designed to achieve relative standard deviations of less than five percent. The specimen is sandwiched between highly conductive upper and lower slabs, each equipped with six thermocouples. The testing is conducted in a vacuum environment, ensuring minimal heat loss and high accuracy in measurements.
Career Highlights
Sealey's career is marked by his association with the United States of America as represented by the Administrator of NASA. His work has been pivotal in advancing the understanding of thermal conductivity in various materials, which has implications in multiple scientific and engineering fields.
Collaborations
Bradley has collaborated with notable colleagues, including Tahani R Amer and Chelakara Subramanian. Their combined expertise has contributed to the successful development and implementation of innovative measurement techniques.
Conclusion
Bradley S Sealey's contributions to the field of thermal conductivity measurement exemplify the impact of innovative thinking in scientific research. His patent reflects a commitment to precision and advancement in material science.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile