Oakland, CA, United States of America

Bradley H Oland

This inventor holds 1 USPTO granted patent. Top assignee: Tinsley Laboratories, Inc.. Active years: 1977.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bradley H Oland. Retrieved from https://idiyas.com/inventor/bradley-h-oland

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1977

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1 patent (USPTO):Explore Patents

Title: The Innovations of Bradley H. Oland

Introduction

Bradley H. Oland is a notable inventor based in Oakland, CA. He has made significant contributions to the field of optical systems, particularly in the realm of color television projection. His innovative approach has led to the development of a unique patent that addresses common challenges in optical design.

Latest Patents

Oland holds a patent for "Truncated Schmidt optical systems for projecting color television." This invention involves a plurality of Schmidt optical systems that are clustered together by truncating mutually adjacent edges of mirrors and correcting lenses that comprise individual Schmidt systems. By clustering these systems, Oland minimizes keystone distortion, enhancing the quality of projected images.

Career Highlights

Bradley H. Oland is associated with Tinsley Laboratories, Inc., where he applies his expertise in optical engineering. His work at Tinsley Laboratories has allowed him to explore and implement advanced optical technologies, contributing to the company's reputation in the industry.

Collaborations

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Conclusion

Bradley H. Oland's contributions to optical systems demonstrate his innovative spirit and commitment to improving technology in the field of color television projection. His patent reflects a significant advancement that benefits both the industry and consumers alike.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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