Hefei, China

Bowen Wu

This inventor holds 1 USPTO granted patent. Top assignee: Anhui University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bowen Wu. Retrieved from https://idiyas.com/inventor/bowen-wu-cth6wtgu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Bowen Wu - Innovator in Analog-to-Digital Conversion Technology

Introduction

Bowen Wu is a prominent inventor based in Hefei, China. He has made significant contributions to the field of analog-to-digital conversion technology. His innovative work focuses on enhancing the performance of successive approximation register analog-to-digital converters (SAR ADCs).

Latest Patents

Bowen Wu holds a patent for a high-speed and low-power successive approximation register analog-to-digital converter (SAR ADC) and an analog-to-digital conversion method. The patent describes a method that performs binary redundancy reassembly to improve a digital-to-analog converter (DAC) capacitor array included in the SAR ADC. This innovation ensures that the total number of capacitors in a capacitor sub-array exceeds the number of precision bits of the SAR ADC, thereby optimizing performance.

Career Highlights

Bowen Wu is affiliated with Anhui University, where he continues to advance research in his field. His work has garnered attention for its practical applications in various electronic devices.

Collaborations

Some of his notable coworkers include Zhixiang Huang and Xueshi Hou, who contribute to the collaborative research environment at Anhui University.

Conclusion

Bowen Wu's contributions to analog-to-digital conversion technology exemplify the innovative spirit of modern inventors. His patent reflects a commitment to improving electronic systems through advanced engineering solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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