Milpitas, CA, United States of America

Bouchaib Hraimel

This inventor holds 1 USPTO granted patent. Top assignee: O-Net Communications Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bouchaib Hraimel. Retrieved from https://idiyas.com/inventor/bouchaib-hraimel-i4ixdmzt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Bouchaib Hraimel and Optical Communication Device Testing

Introduction

Bouchaib Hraimel is an inventor associated with Milpitas, California, and O-Net Communications Limited. His patent work addresses testing optical communication devices, with a focus on securely positioning and electrically connecting a device under test.

Latest Patents

The provided information lists one patent for Hraimel: “Systems and Methods for Testing Optical Communication Devices.” The invention describes a test system with an arm that holds the device under test and uses its predetermined heat capacity as a heat sink. Spring pins secure the device’s pins to pads on a test board, with each pin supporting a 90-gigahertz bandwidth. An actuator aligns the device along the horizontal X-axis and vertical Y-axis, then applies compressive force along the Z-axis to establish an electrical connection with the test board. Hraimel’s listed patent portfolio includes 1 patent.

Career Highlights

Hraimel’s listed work at O-Net Communications Limited connects his professional profile with optical communications technology. His patent describes a testing arrangement designed to manage device positioning, heat, and high-bandwidth electrical connections.

Collaborations

Zining Huang is identified as Hraimel’s coworker. The information provided does not specify whether Huang collaborated on the patent.

Conclusion

Bouchaib Hraimel’s listed invention focuses on a practical test system for optical communication devices, combining thermal management, precise alignment, and high-bandwidth electrical contact.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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