Suwon, South Korea

Bong Woo Lee

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electro-Mechanics Co., Ltd.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bong Woo Lee. Retrieved from https://idiyas.com/inventor/bong-woo-lee-gwj2su7g

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Bong Woo Lee - Innovator in Magnetic Field Measurement Technology

Introduction

Bong Woo Lee is a notable inventor based in Suwon, South Korea. He has made significant contributions to the field of display technology, particularly in the measurement of magnetic fields in deflection yokes.

Latest Patents

Bong Woo Lee holds a patent for a "Magnetic field measuring system of deflection yoke." This invention focuses on product quality testing during the winding step of manufacturing deflection yokes, which are essential components in display devices that utilize cathode ray tubes, such as color televisions and monitors. The patent describes a winding zig designed to measure magnetic fields, incorporating multiple magnetic field sensors, a digital signal generator, a digital signal interface, and a transmitter for processing and transmitting data.

Career Highlights

Bong Woo Lee is currently employed at Samsung Electro-Mechanics Co., Ltd., where he continues to innovate in the field of electronic components. His work has been instrumental in enhancing the quality and efficiency of display technology.

Collaborations

He has collaborated with notable colleagues, including In Jung Yun and Ho Jin Cho, contributing to advancements in their shared field of expertise.

Conclusion

Bong Woo Lee's innovative work in magnetic field measurement technology has made a significant impact on the display device industry. His contributions continue to shape the future of electronic components and display technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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