Company Filing History:
Years Active: 2018
Title: Innovator Spotlight: Bommana S Rao and His Contributions to Circuitry Testing
Introduction: Bommana S Rao is a distinguished inventor based in Hyderabad, Telangana, India. With a keen focus on innovative circuitry solutions, he has made significant strides in enhancing input/output path testing and characterization. His contributions have proven invaluable in the field of electronics.
Latest Patents: Bommana holds a patent for "Input/output path testing and characterization using scan chains." This inventive circuit design showcases a detailed architecture involving input-output pads, receive flip-flops, and transmit flip-flops connected to these pads. The data path control circuitry integrates with data path control flip-flops to selectively manage connections to the input-output pads based on the states of control flip-flops. Moreover, clock control circuitry is adeptly configured to apply varying clock signals to the flip-flops, enhancing the flexibility and performance of the testing process.
Career Highlights: Bommana S Rao has been an integral part of Xilinx, Inc., where his expertise in circuit design and testing continues to drive innovation. His work emphasizes the importance of reliable data path management in modern electronic applications, showcasing his commitment to advancing technology in this domain.
Collaborations: Throughout his career, Bommana has collaborated with notable colleagues, including Banadappa V Shivaray and Ahmad R Ansari. These partnerships underline the collaborative spirit essential in technological innovation, as they work together to push the boundaries of what is possible in circuitry.
Conclusion: Bommana S Rao exemplifies the innovative spirit of today’s inventors. His patent not only highlights his technical prowess but also signifies the importance of collaboration in the advancement of technology. As he continues to evolve in his career, his contributions will undoubtedly play a pivotal role in shaping the future of electronic testing and characterization.