Miaoli County, Taiwan

Bo-Jhang Sun

This inventor holds 1 USPTO granted patent. Top assignees: General Interface Solution Limited, Interface Optoelectronics (Shenzhen), Interface Technology (Chengdu) Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bo-Jhang Sun. Retrieved from https://idiyas.com/inventor/bo-jhang-sun-0m6aotu0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Bo-Jhang Sun: Inventor of a Stress-Resistant Piezoelectric Detection Device

Introduction

Bo-Jhang Sun is an inventor associated with Miaoli County, Taiwan. His work includes a patent for a stress-resistant trace structure designed for use in a piezoelectric detection device. Sun has 1 patent listed in the information provided.

Latest Patents

Sun’s patent, “Stress-Resistant Trace Structure and Piezoelectric Detection Device Made Thereof,” describes a patterned trace layer with a nonlinear pattern positioned on a porous anti-stress layer. The porous layer contains multiple through holes that are vertically interlaced with the nonlinear trace pattern. This arrangement is intended to improve resistance to stress in the trace structure used in a piezoelectric detection device.

Career Highlights

Sun is associated with Interface Technology (Chengdu) Co., Ltd. and Interface Optoelectronics (Shenzhen). The available information does not specify his roles or dates of employment at these companies.

Collaborations

Chih-Chin Ko and Hsin-Yu Chen are identified as Sun’s coworkers. The information provided does not detail specific joint projects or co-inventorship.

Conclusion

Bo-Jhang Sun’s listed patent focuses on a porous, stress-resistant trace design for piezoelectric detection, reflecting his work in electronic structures and sensing devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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