Company Filing History:
Years Active: 2020
Title: Bo-Han Shih: Innovator in Substrate Inspection Technology
Introduction
Bo-Han Shih is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of substrate inspection technology. His innovative approach has led to the development of a unique apparatus that enhances the efficiency and accuracy of substrate inspections.
Latest Patents
Bo-Han Shih holds a patent for an "Apparatus and method for substrate inspection." This invention includes a chamber with a movable holder designed to hold a substrate and transfer it between various positions. The apparatus features a first inspector that inspects the backside of the substrate, a lifter that supports the substrate, and a second inspector that examines the edge of the substrate. This innovative design streamlines the inspection process and improves overall quality control.
Career Highlights
Bo-Han Shih is currently employed at Taiwan Semiconductor Manufacturing Company Ltd. His work at this leading semiconductor manufacturer has allowed him to apply his expertise in substrate inspection technology. His contributions have been instrumental in advancing the company's capabilities in producing high-quality semiconductor products.
Collaborations
Throughout his career, Bo-Han Shih has collaborated with notable colleagues, including Sheng-Hsiang Chuang and Hsu-Shui Liu. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Bo-Han Shih's work in substrate inspection technology exemplifies the impact of innovative thinking in the semiconductor industry. His patent and contributions to Taiwan Semiconductor Manufacturing Company Ltd. highlight his role as a key player in advancing technology in this field.