Igny, France

Bitoune Sylviane


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Bitoune Sylviane

Introduction

Bitoune Sylviane is a notable inventor based in Igny, France. He has made significant contributions to the field of microwave technology, particularly through his innovative patent. His work reflects a deep understanding of the complexities involved in measuring microwave components.

Latest Patents

Bitoune holds a patent for an "Adjustable device for measuring the characteristics of a microwave." This device is designed to be fixed on a measuring instrument, providing access to the terminals of a microwave component. It allows for the measurement of scattering, noise, or output power parameters. The design minimizes the length of connections between the access lines of the device and the input and output terminals of the component being measured. The device features two access blocks that are positionally adjustable, allowing for two degrees of freedom in relative-spacing displacement and lateral translational displacement. This innovation is applicable to various types of components, including chips, packages, or hybrid circuits.

Career Highlights

Bitoune Sylviane is associated with Thomson Hybrides Et Microondes, where he has been able to apply his expertise in microwave technology. His work has contributed to advancements in the measurement and analysis of microwave components, enhancing the efficiency and accuracy of such measurements.

Collaborations

Bitoune has collaborated with notable colleagues, including Francois Grossier and Maurice LeCreff. These collaborations have likely enriched his work and contributed to the innovative solutions he has developed.

Conclusion

Bitoune Sylviane's contributions to microwave technology through his patent demonstrate his innovative spirit and technical expertise. His work continues to influence the field, showcasing the importance of advancements in measurement technology.

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