This inventor holds 1 USPTO granted patent and 1 published patent application and 2 EPO patents. Top assignees: Nuctech Company Limited, Tsinghua University. Active years: 2026.
Company Filing History:
1 out of 571 
1 out of 3,134 
Years Active: 2026
Title: Bintao Wei: Innovator in Ray Scanning Technology
Introduction
Bintao Wei is a prominent inventor based in Beijing, China. He has made significant contributions to the field of ray scanning technology, particularly in the context of luggage conveying systems. His innovative approach has led to the development of a unique ray scanning apparatus that enhances the efficiency and effectiveness of object inspection.
Latest Patents
Bintao Wei holds a patent for a "Ray scanning apparatus and ray scanning system." This invention is designed for a luggage conveying system and includes a conveying device that transports objects through a scanning area. The apparatus features multiple scanning beam planes arranged in the conveying direction, each equipped with a ray source module and a detector assembly. The ray source module consists of several ray source points that emit ray beams, strategically positioned on the lower, left, and right sides of the scanning area.
Career Highlights
Throughout his career, Bintao Wei has worked with notable organizations, including Nuctech Company Limited and Tsinghua University. His experience in these institutions has allowed him to refine his skills and contribute to advancements in technology.
Collaborations
Bintao Wei has collaborated with esteemed colleagues such as Qingping Huang and Yong Zhou. Their combined expertise has fostered innovation and development in their respective fields.
Conclusion
Bintao Wei's contributions to ray scanning technology exemplify his dedication to innovation and improvement in inspection systems. His work continues to influence the industry and pave the way for future advancements.