This inventor holds 1 USPTO granted patent. Top assignee: Jiangsu University. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024
Title: Innovations by Binjie Gao in Crop Disease Detection
Introduction
Binjie Gao is an innovative inventor based in Jiangsu, China. He has made significant contributions to the field of agricultural technology, particularly in the detection of early crop diseases. His work focuses on developing portable solutions that can enhance agricultural productivity and sustainability.
Latest Patents
One of Binjie Gao's notable patents is titled "Portable apparatus for detecting early crop diseases based on spatial frequency domain imaging and detection method using same." This invention provides a portable apparatus designed to detect early crop diseases using spatial frequency domain imaging. The apparatus consists of an end cover, a spatial frequency domain imaging apparatus, a dark box body, a telescopic section, and an opening-and-closing apparatus connected in sequence. The detection method involves placing a crop sample into the dark box body, projecting structured light patterns onto the sample, and capturing diffuse reflection images. The images are then processed to determine if the crop sample has a disease.
Career Highlights
Binjie Gao is affiliated with Jiangsu University, where he continues to advance research in agricultural technology. His work has garnered attention for its practical applications in improving crop health and yield.
Collaborations
Binjie Gao collaborates with esteemed colleagues, including Aichen Wang and Huadong Cao, who contribute to his research efforts and innovations in the field.
Conclusion
Binjie Gao's contributions to crop disease detection through innovative technology highlight the importance of research in agriculture. His work not only addresses immediate agricultural challenges but also paves the way for future advancements in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile