Lyon, France

Binh V Thien

This inventor holds 1 USPTO granted patent. Top assignee: Thomson Recherche. Active years: 1996.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Binh V Thien: Innovator in Electron Source Technology

Introduction

Binh V Thien is a notable inventor based in Lyon, France. He has made significant contributions to the field of electron source technology. His innovative work has led to the development of a unique patent that enhances the efficiency of electron sources.

Latest Patents

Binh V Thien holds a patent for a "Micropoint cathode electron source with a focusing electrode." This invention features an electron source designed in the form of a micropoint cathode electrode. The microcathode is strategically located in a cavity of a dielectric material. A first gate electrode surrounds this cavity, while a second gate electrode encircles the first. The electrodes are configured to different potentials, allowing the first gate electrode to function as an extraction electrode and the second as a focusing electrode. This innovative design improves the performance of electron sources in various applications.

Career Highlights

Binh V Thien is associated with Thomson Recherche, where he has been instrumental in advancing research in electron source technology. His work has garnered attention for its potential applications in various scientific and industrial fields.

Collaborations

Binh V Thien has collaborated with esteemed colleagues such as Didier Pribat and Pierre Legagneux. Their combined expertise has contributed to the success of their projects and innovations.

Conclusion

Binh V Thien is a prominent figure in the realm of electron source technology, with a patent that showcases his innovative spirit. His contributions continue to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
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