Xiamen, China

Binbin Zhang

This inventor holds 1 USPTO granted patent. Top assignee: Xiamen University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Binbin Zhang. Retrieved from https://idiyas.com/inventor/binbin-zhang-airg6q4u

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations in Optical Systems by Binbin Zhang

Introduction

Binbin Zhang is an accomplished inventor based in Xiamen, China. He has made significant contributions to the field of optical testing, particularly through his innovative designs and patents. His work focuses on optimizing the structure of objective lenses, which are crucial components in various optical devices.

Latest Patents

Binbin Zhang holds a patent for an objective lens, an optical imaging device, an optical system, and a test method of the optical system. This invention relates to the field of optical testing and aims to enhance the performance of optical systems. The objective lens comprises a housing with a cavity that features a first opening and a second opening. The optical focusing assembly is mounted within this cavity, with its focal point located at the second opening. This assembly is designed to focus light entering the housing from the first opening to the focal point, utilizing either the reflection principle or the refraction principle.

Career Highlights

Binbin Zhang is affiliated with Xiamen University, where he continues to advance his research in optical systems. His work has garnered attention for its practical applications in improving optical imaging technologies.

Collaborations

Binbin has collaborated with notable colleagues, including Hailong Wang and Songyuan Ding, who contribute to the research and development of optical technologies.

Conclusion

Binbin Zhang's innovative work in optical systems exemplifies the importance of research and development in advancing technology. His contributions are paving the way for future advancements in optical imaging and testing methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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