West Lafayette, IN, United States of America

Bin Shen

This inventor holds 2 USPTO granted patents. Top assignee: Google Inc.. Active years: 2014-2017.


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2014-2017

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2 patents (USPTO):Explore Patents

Title: Innovations of Bin Shen

Introduction

Bin Shen is an accomplished inventor based in West Lafayette, IN (US). He has made significant contributions to the field of image processing and annotation. With a total of 2 patents to his name, his work has garnered attention in the tech industry.

Latest Patents

One of Bin Shen's latest patents is titled "Refining image annotations - Methods, systems and apparatus for refining image annotations." This innovative method involves receiving a set of labels for each image, which are indicative of the subject matter. For each label, confidence values are determined to assess how accurately the label describes the image. Labels that meet a specific confidence threshold are identified as high confidence labels. Images with a sufficient number of high confidence labels are classified as high confidence images. This method enhances the accuracy and reliability of image annotations.

Career Highlights

Bin Shen is currently employed at Google Inc., where he continues to develop and refine his innovative ideas. His work at Google has allowed him to collaborate with some of the brightest minds in the industry, further advancing his research and inventions.

Collaborations

Some of his notable coworkers include Neil G Alldrin and Charles Joseph Rosenberg. Their collaboration has contributed to the success of various projects within the company.

Conclusion

Bin Shen's contributions to image annotation technology demonstrate his innovative spirit and dedication to advancing the field. His patents reflect a commitment to improving the accuracy of image processing, making a significant impact in the tech industry.

Profile summary based on public USPTO records.
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