This inventor holds 1 USPTO granted patent. Top assignee: University of Illinois. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Bin Peng and Crop Yield Prediction
Introduction
Bin Peng is an inventor associated with the University of Illinois in Savoy, Illinois. His patent work addresses crop yield prediction, combining crop development information with modeling to estimate yields at different geographic scales.
Latest Patents
Peng is credited with 1 patent: “Apparatus and Method for Crop Yield Prediction.” The invention describes a processing system that identifies occurrences of one or more crop phenology stages and uses those observations to optimize a yield model. The optimized model produces a predicted yield for a first region, which is then used to generate a prediction for a smaller second region. The disclosure also notes that additional embodiments are possible.
Career Highlights
The available information connects Peng’s inventive work with the University of Illinois. His patent focuses on using crop growth stages to refine yield estimates across regions of different sizes.
Collaborations
Jian Peng is identified as a coworker. The provided information does not specify further details about their collaboration.
Conclusion
Bin Peng’s patent presents a method for refining crop yield predictions by linking observed phenology stages to regional yield models, with the aim of producing estimates for both broader and smaller areas.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile