This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1992.
Company Filing History:
1 out of 834,350 Years Active: 1992
Title: Innovations of Bin-Ming B Isai
Introduction
Bin-Ming B Isai is an accomplished inventor based in Saratoga, CA (US). He has made significant contributions to the field of optical inspection systems. His innovative approach has led to the development of a unique patent that enhances the efficiency of substrate inspections.
Latest Patents
Bin-Ming B Isai holds a patent for an "Automatic high speed optical inspection system." This system utilizes at least one TDI sensor to image portions of interest on a substrate that are uniformly or critically illuminated. In one configuration, the substrate is compared to expected characteristic features that are prestored in memory. Another configuration inspects patterns on the substrate by comparing them against each other, noting any agreements or discrepancies. This method is particularly useful for die-to-die inspections and repeating pattern inspections within the same die.
Career Highlights
Throughout his career, Bin-Ming B Isai has demonstrated a commitment to advancing optical inspection technologies. His work has not only contributed to the efficiency of inspections but has also paved the way for future innovations in the field. His patent reflects a deep understanding of the complexities involved in substrate imaging and inspection.
Collaborations
Bin-Ming B Isai has collaborated with notable professionals in his field, including Walter I Novak and John D Greene. These collaborations have likely enriched his work and contributed to the success of his innovations.
Conclusion
Bin-Ming B Isai's contributions to optical inspection systems exemplify the impact of innovative thinking in technology. His patent showcases a sophisticated approach to substrate inspection that is both efficient and effective. His work continues to influence the field and inspire future advancements.