Fujian, China

Bin Lan

This inventor holds 1 USPTO granted patent. Top assignee: Contemporary Amperex Technology Co., Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bin Lan. Retrieved from https://idiyas.com/inventor/bin-lan-rtr9es97

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Bin Lan

Introduction

Bin Lan is a notable inventor based in Fujian, China. He has made significant contributions to the field of control software testing. His innovative approach aims to enhance the efficiency of simulation-based debugging processes.

Latest Patents

Bin Lan holds a patent for a "Method and apparatus for testing control software by injecting fault signals into a simulation environment, and computer-readable storage medium." This invention provides a method and apparatus for testing control software, which reduces the time consumed in simulation-based debugging. The method involves obtaining test information of multiple fault signals and sequentially injecting these signals into a simulation environment to obtain test results.

Career Highlights

Bin Lan is currently associated with Contemporary Amperex Technology Co., Ltd. His work focuses on improving the reliability and efficiency of control software through innovative testing methods. His patent reflects his commitment to advancing technology in this area.

Collaborations

Bin Lan has collaborated with notable colleagues, including Jianping Bai and Xuming Wang. Their combined expertise contributes to the development of cutting-edge solutions in control software testing.

Conclusion

Bin Lan's contributions to the field of control software testing exemplify the importance of innovation in technology. His patent demonstrates a significant advancement in enhancing debugging efficiency, showcasing his role as a leading inventor in this domain.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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