Zhejiang, China

Bin Han

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Hangzhou Dalton Biosciences, Ltd.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bin Han. Retrieved from https://idiyas.com/inventor/bin-han-n93a0j0s

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Bin Han

Introduction

Bin Han is a notable inventor based in Zhejiang, China. He has made significant contributions to the field of medical technology, particularly in the detection of high-risk human papillomaviruses (HPV). His work is crucial in advancing methods for diagnosing HPV, which is linked to various health issues.

Latest Patents

Bin Han holds a patent for a "Method for detecting and typing high-risk human papillomaviruses." This invention relates to a method that utilizes a probe with a specific detection function for 14 types of high-risk HPV. The technology developed is based on nucleic acid hybridization chemiluminescence immunoassay technology, which enhances the accuracy and efficiency of HPV detection.

Career Highlights

He is currently associated with Hangzhou Dalton Biosciences, Ltd., where he continues to innovate in the field of biosciences. His expertise and dedication have positioned him as a key figure in the development of diagnostic technologies.

Collaborations

Some of his notable coworkers include Yingjia Shou and Jiefeng Hu, who contribute to the collaborative efforts in research and development at their company.

Conclusion

Bin Han's work exemplifies the importance of innovation in medical technology, particularly in the fight against HPV. His contributions are vital for improving diagnostic methods and enhancing public health outcomes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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