Biagio Russo

Title: Biagio Russo: Inventor in Semiconductor Testing

Introduction

Biagio Russo is an inventor based in Tremestieri Etneo, Italy. His patent work focuses on methods and equipment for testing integrated circuits, including improving radio-frequency measurement accuracy and coordinating test measurements.

Latest Patents

Russo’s listed patents address two aspects of automated integrated-circuit testing.

“Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers” describes a process for improving radio-frequency measurement accuracy during wafer testing. It uses calibration and de-embedding phases to account for the testing equipment, configuration board, and wafer-level connections, helping establish measurements at the wafer die plane.

“Method and apparatus for testing integrated circuits using a synchronization signal so that all measurements are allotted a time slot of the same length” describes a synchronized testing approach. A periodic signal coordinates changes to integrated-circuit test conditions so that each measurement receives a time slot of equal length. The patent also describes automatic test equipment configured to provide that synchronization.

Career Highlights

Russo is associated with STMicroelectronics S.r.l. His listed inventions concern practical challenges in automated semiconductor testing, from measurement accuracy to consistent timing across test sequences. His patent portfolio includes 2 patents.

Collaborations

Russo’s listed coworkers include Giuseppe Di Gregorio and Giuseppe Tuttobene. His work at STMicroelectronics places his inventions within the company’s semiconductor technology and testing environment.

Conclusion

Biagio Russo’s patent work centers on improving the accuracy and consistency of automated integrated-circuit testing, with inventions addressing wafer-level RF measurements and synchronized test timing.