Suwon, South Korea

Bharath Kumar N

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bharath Kumar N. Retrieved from https://idiyas.com/inventor/bharath-kumar-n

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Bharath Kumar N: Semiconductor Clock-Skew Calibration

Introduction

Bharath Kumar N is an inventor based in Suwon, South Korea, and is associated with Samsung Electronics Ltd. His work includes a patented semiconductor-device technique for detecting and calibrating clock skew.

Latest Patents

The provided patent information lists one patent for Bharath Kumar N: “Semiconductor package calibrating skew of clock signal, semiconductor device, and operating method of the semiconductor device.” The invention describes a receiver that samples data and track signals using internal clock-signal pairs. A controller assesses skew by counting how often a specified logic level of the track signal is sampled in synchronization with each clock pair, then provides a clock-shift signal to calibrate the skew. The record lists 1 patent.

Career Highlights

Bharath Kumar N’s listed patent focuses on clock-signal timing calibration in semiconductor devices, addressing the detection and correction of skew between a track signal and internal clock signals.

Collaborations

The provided information names TagGun Lee and Seongyoon Kim as coworkers. It does not specify their roles in the patent or describe particular collaborative contributions.

Conclusion

Bharath Kumar N’s listed invention concerns a method for detecting and calibrating clock skew in semiconductor devices, reflecting his association with semiconductor innovation at Samsung Electronics Ltd.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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