Yorktown Heights, NY, United States of America

Betram L Koslin

This inventor holds 1 USPTO granted patent. Top assignee: Touchstone Applied Science Associates, Inc.. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Betram L Koslin. Retrieved from https://idiyas.com/inventor/betram-l-koslin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: The Innovations of Betram L. Koslin

Introduction

Betram L. Koslin is an accomplished inventor based in Yorktown Heights, NY. He has made significant contributions to the field of educational assessment through his innovative designs. His work focuses on creating devices that enhance the efficiency and accuracy of test scoring.

Latest Patents

One of Koslin's notable patents is the "Test Answer and Score Sheet Device." This invention features a markable sheet arrangement with at least one surface that includes answer mark guide indicia. The guide indicia define sets of first positions where respondents can make marks in response to corresponding questions. Additionally, the sheet arrangement has a surface with discriminable flag indicia that convey correct responses according to a given test form or answer key. This design enables rapid manual or electronic grading of the chosen responses, streamlining the assessment process.

Career Highlights

Koslin is associated with Touchstone Applied Science Associates, Inc., where he applies his expertise in developing educational tools. His work has been instrumental in improving the way assessments are conducted and graded, benefiting both educators and students alike.

Conclusion

Betram L. Koslin's innovative contributions to educational assessment through his patented devices demonstrate his commitment to enhancing the testing process. His work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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