Dordrecht, Netherlands

Bertram Adriaan Van Der Zwan

This inventor holds 1 USPTO granted patent. Top assignee: Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bertram Adriaan Van Der Zwan. Retrieved from https://idiyas.com/inventor/bertram-adriaan-van-der-zwan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Bertram Adriaan Van Der Zwan: Innovator in Optical Inspection Technology

Introduction

Bertram Adriaan Van Der Zwan is a notable inventor based in Dordrecht, Netherlands. He has made significant contributions to the field of optical inspection technology, particularly with his innovative patent that addresses the inspection of planar object surfaces.

Latest Patents

Van Der Zwan holds a patent for an optical inspection device and method. This device is designed to inspect a planar object surface for the presence of particles and defects. The technology utilizes a light source that illuminates the object surface at a grazing angle. An image sensor captures light scattered from particles and defects on the surface, allowing for effective inspection.

Career Highlights

Van Der Zwan is associated with the Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek (TNO), where he has been instrumental in advancing research and development in optical inspection technologies. His work has led to the creation of devices that enhance the accuracy and efficiency of surface inspections.

Collaborations

Some of his notable coworkers include Sjoerd Oostrom and Bart Gerardus Speet. Their collaborative efforts have contributed to the success of various projects within the organization.

Conclusion

Bertram Adriaan Van Der Zwan's contributions to optical inspection technology exemplify his innovative spirit and dedication to improving inspection methods. His patent reflects a significant advancement in the field, showcasing the importance of research and collaboration in driving technological progress.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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