Berkeley, CA, United States of America

Bertram A Pohl

This inventor holds 1 USPTO granted patent. Top assignee: Lawrence Livermore National Security, LLC. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bertram A Pohl. Retrieved from https://idiyas.com/inventor/bertram-a-pohl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Bertram A Pohl: Innovator in Nuclear Material Detection

Introduction

Bertram A Pohl is a notable inventor based in Berkeley, CA. He has made significant contributions to the field of nuclear material detection. His innovative work focuses on enhancing security measures for cargo inspections.

Latest Patents

Pohl holds a patent for a "Neutron interrogation system using high gamma ray signature to detect contraband special nuclear materials in cargo." This system is designed to inspect cargo for the presence of special nuclear material. The process involves irradiating the cargo with neutrons, which produce fission products in the special nuclear material. These products generate gamma rays that indicate the presence of the special nuclear material.

Career Highlights

Bertram A Pohl is associated with Lawrence Livermore National Security, LLC, where he applies his expertise in nuclear detection technologies. His work has been instrumental in developing systems that enhance national security.

Collaborations

Pohl has collaborated with notable colleagues, including Dennis R Slaughter and Arden D Dougan. Their combined efforts contribute to advancements in the field of nuclear material detection.

Conclusion

Bertram A Pohl's innovative contributions to nuclear material detection exemplify the importance of technology in enhancing security measures. His work continues to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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