This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1996.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1996
Title: Bernd Stenkamp: Innovator in Micropolarimetry
Introduction
Bernd Stenkamp is a notable inventor based in Mainz, Germany. He has made significant contributions to the field of optics, particularly through his innovative work on micropolarimetry. His expertise and inventions have paved the way for advancements in the characterization of thin films.
Latest Patents
Stenkamp holds a patent for a micropolarimeter, which includes a microsensor system and a method for characterizing thin films. The micropolarimeter consists of an analyzer and a detector, typically a photodetector array. The detector features a circular configuration with multiple sectors, allowing for the assignment of different polarization values. Notably, both the analyzer and detector are designed without any moving parts. The patent proposes three different embodiments for the analyzer, including a glass cone with a polarizing thin film stack, a metal grid polarizing array, and an array of polarizing waveguides. This micropolarimeter is particularly useful in microellipsometer systems, serving as a valuable tool for film diagnostics and optical characterization of thin films.
Career Highlights
Stenkamp is associated with International Business Machines Corporation (IBM), where he has contributed to various projects and innovations. His work has been instrumental in advancing the technology related to micropolarimetry and its applications in different fields.
Collaborations
Throughout his career, Stenkamp has collaborated with notable colleagues, including Peter Pokrowsky and Eckehard Kiefer. These collaborations have further enhanced his research and development efforts in the field of optics.
Conclusion
Bernd Stenkamp's contributions to micropolarimetry exemplify the impact of innovative thinking in the field of optics. His patent and work at IBM highlight the importance of advancements in technology for the characterization of thin films.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
